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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding

Author(s)
Yoon, ChangwookTsiklauri, MikheilZvonkin, MikhailChen, Qinghua BillAflaki, AmanKim, JingookFan, JunDrewniak, James L.
Issued Date
2015-08
DOI
10.1109/TEMC.2014.2379627
URI
https://scholarworks.unist.ac.kr/handle/201301/11844
Fulltext
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7194924
Citation
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.57, no.4, pp.836 - 846
Abstract
Time-domain channel characterization (TCC) for deembedding of an asymmetric fixture is introduced. Two design criteria for the design of a 2x-thru are proposed. Error sensitivity regarding a small error in the S-parameters of the 1x-fixture is analyzed with an insertion loss error-coefficient and a return loss error-coefficient. The TCC procedure, including proposed design criteria and error sensitivity, is also introduced to reduce the error in the TCC application. Three different 2x-thru structures are investigated for the verification of the two proposed design criteria and analyzed for error sensitivity. Test fixtures on a printed circuit boards are fabricated for the experimental verification.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
ISSN
0018-9375
Keyword
De-embeddingdesign criteriaerror-coefficienterror sensitivityinsertion loss error-coefficient (ILEC)return loss error-coefficient (RLEC)time-domain channel characterization (TCC)

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