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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 846 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 836 | - |
dc.citation.title | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | - |
dc.citation.volume | 57 | - |
dc.contributor.author | Yoon, Changwook | - |
dc.contributor.author | Tsiklauri, Mikheil | - |
dc.contributor.author | Zvonkin, Mikhail | - |
dc.contributor.author | Chen, Qinghua Bill | - |
dc.contributor.author | Aflaki, Aman | - |
dc.contributor.author | Kim, Jingook | - |
dc.contributor.author | Fan, Jun | - |
dc.contributor.author | Drewniak, James L. | - |
dc.date.accessioned | 2023-12-22T01:06:43Z | - |
dc.date.available | 2023-12-22T01:06:43Z | - |
dc.date.created | 2015-07-03 | - |
dc.date.issued | 2015-08 | - |
dc.description.abstract | Time-domain channel characterization (TCC) for deembedding of an asymmetric fixture is introduced. Two design criteria for the design of a 2x-thru are proposed. Error sensitivity regarding a small error in the S-parameters of the 1x-fixture is analyzed with an insertion loss error-coefficient and a return loss error-coefficient. The TCC procedure, including proposed design criteria and error sensitivity, is also introduced to reduce the error in the TCC application. Three different 2x-thru structures are investigated for the verification of the two proposed design criteria and analyzed for error sensitivity. Test fixtures on a printed circuit boards are fabricated for the experimental verification. | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.57, no.4, pp.836 - 846 | - |
dc.identifier.doi | 10.1109/TEMC.2014.2379627 | - |
dc.identifier.issn | 0018-9375 | - |
dc.identifier.scopusid | 2-s2.0-84939814792 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/11844 | - |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7194924 | - |
dc.identifier.wosid | 000360015200027 | - |
dc.language | 영어 | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic; Telecommunications | - |
dc.relation.journalResearchArea | Engineering; Telecommunications | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | De-embedding | - |
dc.subject.keywordPlus | design criteria | - |
dc.subject.keywordPlus | error-coefficient | - |
dc.subject.keywordPlus | error sensitivity | - |
dc.subject.keywordPlus | insertion loss error-coefficient (ILEC) | - |
dc.subject.keywordPlus | return loss error-coefficient (RLEC) | - |
dc.subject.keywordPlus | time-domain channel characterization (TCC) | - |
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