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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.endPage 846 -
dc.citation.number 4 -
dc.citation.startPage 836 -
dc.citation.title IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY -
dc.citation.volume 57 -
dc.contributor.author Yoon, Changwook -
dc.contributor.author Tsiklauri, Mikheil -
dc.contributor.author Zvonkin, Mikhail -
dc.contributor.author Chen, Qinghua Bill -
dc.contributor.author Aflaki, Aman -
dc.contributor.author Kim, Jingook -
dc.contributor.author Fan, Jun -
dc.contributor.author Drewniak, James L. -
dc.date.accessioned 2023-12-22T01:06:43Z -
dc.date.available 2023-12-22T01:06:43Z -
dc.date.created 2015-07-03 -
dc.date.issued 2015-08 -
dc.description.abstract Time-domain channel characterization (TCC) for deembedding of an asymmetric fixture is introduced. Two design criteria for the design of a 2x-thru are proposed. Error sensitivity regarding a small error in the S-parameters of the 1x-fixture is analyzed with an insertion loss error-coefficient and a return loss error-coefficient. The TCC procedure, including proposed design criteria and error sensitivity, is also introduced to reduce the error in the TCC application. Three different 2x-thru structures are investigated for the verification of the two proposed design criteria and analyzed for error sensitivity. Test fixtures on a printed circuit boards are fabricated for the experimental verification. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.57, no.4, pp.836 - 846 -
dc.identifier.doi 10.1109/TEMC.2014.2379627 -
dc.identifier.issn 0018-9375 -
dc.identifier.scopusid 2-s2.0-84939814792 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/11844 -
dc.identifier.url http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7194924 -
dc.identifier.wosid 000360015200027 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Telecommunications -
dc.relation.journalResearchArea Engineering; Telecommunications -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus De-embedding -
dc.subject.keywordPlus design criteria -
dc.subject.keywordPlus error-coefficient -
dc.subject.keywordPlus error sensitivity -
dc.subject.keywordPlus insertion loss error-coefficient (ILEC) -
dc.subject.keywordPlus return loss error-coefficient (RLEC) -
dc.subject.keywordPlus time-domain channel characterization (TCC) -

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