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Showing results 1 to 9 of 9

An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy File

Lee, Eunjoo , Kim, Minseo , Seong, Jungwoo , Shin, Heungjoo , Lim, Geunbae

Article Issue Date2013-06 View6
Bitmap-assisted focused ion beam fabrication of combined atomic force scanning electrochemical Microscopy probes

Moon, Jong-Seok , Shin, Heungjoo , Mizaikoff, Boris , Kranz, Christine

Article Issue Date2007-09 View1
Creating Well-Defined Hot Spots for Surface-Enhanced Raman Scattering by Single-Crystalline Noble Metal Nanowire Pairs File File

Kang, Taejoon , Yoon, Ilsun , Jeon, Ki-Seok , Choi, Wonjun , Lee, Yonghoon , Seo, Kwanyong , Yoo, Youngdong , Park, Q-Han , Ihee, Hyotcherl , Suh, Yung Doug , et al

Article Issue Date2009-05 View4
Development of wafer-level batch fabrication for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probes File

Shin, Heungjoo , Hesketh, P. J. , Mizaikofff, B. , Kranz, C.

Article Issue Date2008-09 View10
Fibronectin-Carbon-Nanotube Hybrid Nanostructures for Controlled Cell Growth File

Namgung, Seon , Kim, Taekyeong , Baik, Ku Youn , Lee, Minbaek , Nam, Jwa-Min , Hong, Seunghun

Article Issue Date2011-01 View3
Flat-Lying Semiconductor-Insulator Interfacial Layer in DNTT Thin Films File

Jung, Min-Cherl , Leyden, Matthew R. , Nikiforov, Gueorgui O. , Lee, Michael V. , Lee, Han-Koo , Shin, Tae Joo , Takimiya, Kazuo , Qi, Yabing

Article Issue Date2015-01 View4
Probing nanoscale surface enhanced Raman-scattering fluctuation dynamics using correlated AFM and confocal ultramicroscopy File

Suh, Yung Doug , Schenter, GK , Zhu, LY , Lu, HP

Article Issue Date2003-10 View11
Single-Molecule Force Spectroscopy of Membrane Protein Folding File

Wijesinghe, W.C. Bhashini , Min, Duyoung

Article Issue Date2023-06 View6
Tribological properties of bio-mimetic nano-patterned polymeric surfaces on silicon wafer File

Yoon, E.-S. , Singh, R.A. , Kong, H. , Kim, B. , Kim, D.-H. , Jeong, Hoon Eui , Suh, K.Y.

Article Issue Date2006-01 View4
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