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A novel methodology for speeding up IC performance in 32nm FinFET File File

Nguyen, Hung Viet , Ryu, Myunghwan , Kim, Youngmin

Article Issue Date2012-02 View98
Diffusion-rounded CMOS for improving both I-on and I-off characteristics File File

Ryu, Myunghwan , Nguyen, Hung Viet , Kim, Youngmin

Article Issue Date2011-11 View128
TSV Geometrical Variations and Optimization Metric with Repeaters for 3D IC File

Nguyen, Hung Viet , Ryu, Myunghwan , Kim, Youngmin

Article Issue Date2012-12 View118
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