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Application of Deep Reinforcement Learning to Dynamic Verification of DRAM Designs File

Choi, Hyojin , Huh, In , Kim, Seungju , Ko, Jeonghoon , Jeong, Changwook , Son, Hyeonsik , Kwon, Kiwon , Chai, Joonwan , Park, Younsik , Jeong, Jaehoon , et al

Conference Paper Issue Date2021-12-05 View112
Bridging TCAD and AI: Its Application to Semiconductor Design File

Jeong, Changwook , Myung, Sanghoon , Huh, In , Choi, Byungseon , Kim, Jinwoo , Jang, Hyunjae , Lee, Hojoon , Park, Daeyoung , Lee, Kyuhun , Jang, Wonik , et al

Article Issue Date2021-11 View187
Isometric Quotient Variational Auto-Encoders for Structure-Preserving Representation Learning

Huh, In , Choe, Jae Myung , Kim, Young-Gu , Kim, Dae Sin , Jeong, Changwook

Conference Paper Issue Date2023-12-14 View57
Physics-augmented neural compact model for emerging device technologies File

Kim, Yohan , Myung, Sanghoon , Ryu, Jisu , Jeong, Changwook , Kim, Dae Sin

Conference Paper Issue Date2020-09-23 View85
Prediction and Interpretation of Polymer Properties Using the Graph Convolutional Network File

Park, Jaehong , Shim, Youngseon , Lee, Franklin , Rammohan, Aravind , Goyal, Sushmit , Shim, Munbo , Jeong, Changwook , Kim, Dae Sin

Article Issue Date2022-01 View118
Real-time TCAD: A new paradigm for TCAD in the artificial intelligence era File

Myung, Sanghoon , Kim, Jinwoo , Jeon, Yongwoo , Jang, Wonik , Huh, In , Kim, Jaemin , Han, Songyi , Baek, Kang-Hyun , Ryu, Jisu , Kim, Yoon-Suk , et al

Conference Paper Issue Date2020-09-23 View122
Realistic and Scalable TCAD for Yield-Aware Full-Chip DTCO

Park, Min Chul , Chae, Usuk , Kim, Sangyeon , Kim, Yeji , Kwon, Segab , Lee, Sungyeop , Lee, Ji-Hye , Shin, Byungchul , Jang, Hyunjae , Kim, Namjae , et al

Conference Paper Issue Date2025-06-10 View14
Restructuring TCAD System: Teaching Traditional TCAD New Tricks File

Myung, Sanghoon , Jang, Wonik , Jin, Seonghoon , Choe, Jae Myung , Jeong, Changwook , Kim, Dae Sin

Conference Paper Issue Date2021-12-11 View98
Simulator acceleration and inverse design of fin field-effect transistors using machine learning File

Kim, Insoo , Park, So Jeong , Jeong, Changwook , Shim, Munbo , Kim, Dae Sin , Kim, Gyu-Tae , Seok, Junhee

Article Issue Date2022-01 View72
The Impact of Dislocation on Bulk -Si FinFET Technologies: Physical Modeling of Strain Relaxation and Enhancement by Dislocation File

Min, Jeong Guk , Jeong, Changwook , Kwon, Uihui , Kim, Dae Sin , Kim, Suhyun , Kim, Ilryoung , Yang, Joon-Sung

Conference Paper Issue Date2018-10-14 View117
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