Showing results 1 to 3 of 3
Issue Date | Title | Author(s) | Type | View |
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2016-06-12 | Device optimization on gate oxide and spacer dielectric permittivity for 'well-tempered' nanoscale MOSFET | Jang, Esan; Shin, Sunhae; Jung, Jae Won; Jung, Yu Jung; Kim, Kyung Rok | CONFERENCE | 38 |
2015-06 | Gate induced drain leakage reduction with analysis of gate fringing field effect on high-kappa/metal gate CMOS technology | Jang, Esan; Shin, Sunhae; Jung, Jae Won; Kim, Kyung Rok | ARTICLE | 741 |
2015-07-02 | Multi-Valued Logic Based on CMOS technology | Kim, Kyung Rok; Shin, Sunhae; Jang, Esan; Jung, Jae Won | CONFERENCE | 40 |