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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)TypeView
2007-06Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)Eckhard, K.; Shin, Heungjoo; Mizaikoff, B.; Schuhmann, W.; Kranz, C.ARTICLE660
2007-05-08Alternating Current (AC) Impedence Imaging with Combined Atomic Force Scanning Electrochemical Microscopy (AFM-SECM)Shin, Heungjoo; Eckhard, K.; Mizaikoff, B.; Schuhmann, W.; Kranz, C.CONFERENCE90
Showing results 1 to 2 of 2

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