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Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications File

Cho, H.-J. , Oh, H.S. , Nam, K.J. , Kim, Y.H. , Yeo, K.H. , Kim, W.D. , Chung, Y.S. , Nam, Y.S. , Kim, S.M. , Kwon, W.H. , et al

Conference Paper Issue Date2016-06-13 View7
Simulator acceleration and inverse design of fin field-effect transistors using machine learning File

Kim, Insoo , Park, So Jeong , Jeong, Changwook , Shim, Munbo , Kim, Dae Sin , Kim, Gyu-Tae , Seok, Junhee

Article Issue Date2022-01 View5
Switching current scaling and reliability evaluation in PRAM

Jeong, Changwook

Conference Paper Issue Date2004-08-22 View1
The Impact of Dislocation on Bulk -Si FinFET Technologies: Physical Modeling of Strain Relaxation and Enhancement by Dislocation File

Min, Jeong Guk , Jeong, Changwook , Kwon, Uihui , Kim, Dae Sin , Kim, Suhyun , Kim, Ilryoung , Yang, Joon-Sung

Conference Paper Issue Date2018-10-14 View11
Thermal conductivity of bulk and thin-film silicon: A Landauer approach File

Jeong, Changwook , Datta, Supriyo , Lundstrom, Mark

Article Issue Date2012-05 View6
Writing current reduction and total set resistance analysis in PRAM File

Jeong, Changwook , Kang, D. H. , Ha, D. W. , Song, Y. J. , Oh, J. H. , Kong, J. H. , Yoo, J. H. , Park, J. H. , Ryoo, K. C. , Lim, D. W. , et al

Article Issue Date2008-04 View7
플라즈마 도움 원자층 제어 증착법을 이용한 Al2O3 의 성장과 박막 특성의 연구

정창욱 , 이장식 , 주승기

Article Issue Date2000-10 View10
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