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Showing results 1 to 19 of 19

Issue DateTitleAuthor(s)TypeView
2013A high resolution and high linearity 45 nm CMOS fully digital voltage sensor for low power applicationsRyu, Myunghwan; Kim, YoungminARTICLE340
201202A novel methodology for speeding up IC performance in 32nm FinFETNguyen, Hung Viet; Ryu, Myunghwan; Kim, YoungminARTICLE269
201410A performance analysis for interconnections of 3D ICs with frequency-dependent TSV model in S-parameterHan, Ki Jin; Lim, Younghyun; Kim, YoungminARTICLE338
201509A Wide Range On-Chip Leakage Sensor Using a Current-Frequency Converting Technique in 65-nm Technology NodeChoi, Jaehyouk; Kang, Yesung; Kim, YoungminARTICLE413
201412Comprehensive Performance Analysis of Interconnect Variation by double and triple patterning lithography processesKim, Youngmin; Lee, Jaemin; Ryu, MyunghwanARTICLE275
2015-02Cryptography Engine Design for IEEE 1609.2 WAVE Secure Vehicle Communication using FPGAKim, Youngmin; Jeong, ChanbokMaster's thesis1138
201111Diffusion-rounded CMOS for improving both I-on and I-off characteristicsRyu, Myunghwan; Nguyen, Hung Viet; Kim, YoungminARTICLE284
201508Impacts of Trapezoidal Fin of 20-nm Double-Gate FinFET on the Electrical Characteristics of CircuitsRyu, Myunghwan; Kim, YoungminARTICLE163
201305Intra-gate length biasing for leakage optimization in 45nm technology nodeKang Yesung; Kim, YoungminARTICLE302
201606Novel adaptive power-gating strategy and tapered TSV structure in multilayer 3D ICKim, Seung Won; Kang, Seokhyeong; Han, Ki Jin; Kim, YoungminARTICLE283
2012-08Novel IC designs with 32 nm Independent-Gate FinFETKim, Youngmin; Nguyen, Hung VietMaster's thesis382
201506On-chip interconnect boosting technique by using of 10-nm double gate-all-around (DGAA) transistorLee, Jaemin; Ryu, Myunghwan; Kim, YoungminARTICLE241
201601Optimal inverter logic gate using 10-nm double gate-all-around (DGAA) transistor with asymmetric channel widthRyu, Myunghwan; Bien, Franklin; Kim, YoungminARTICLE148
200709Self-compensating design for reduction of timing and leakage sensitivity to systematic pattern-dependent variationGupta, Puneet; Kahng, Andrew B.; Kim, Youngmin; Sylvester, DennisARTICLE255
2013-08Simple and accurate modeling of the 3D structural variations in FinFETsKim, Youngmin; Kim, DonghuMaster's thesis482
200908Simple and Accurate Models for Capacitance Considering Floating Metal Fill InsertionKim, Youngmin; Petranovic, D.; Sylvester, D.ARTICLE216
2013Trapezoidal approximation for on-current modeling of 45-nm non-rectilinear gate shapeRyu, Myunghwan; Kim, YoungminARTICLE331
201212TSV Geometrical Variations and Optimization Metric with Repeaters for 3D ICNguyen, Hung Viet ; Ryu, Myunghwan; Kim, YoungminARTICLE250
2013-07차세대 반도체 공정에 최적화된 회로 설계 (DFM)를 위한 정확한 온-칩 파라미터 변화 (OCV) 모델링에 대한 연구Kim, YoungminResearch Report623
Showing results 1 to 19 of 19

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