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An optimal operating point by using error monitoring circuits with an error-resilient technique

Author(s)
Lee, JaeminKim, SeungwonKim, YoungminKang, Seokhyeong
Issued Date
2015-10-05
DOI
10.1109/VLSI-SoC.2015.7314394
URI
https://scholarworks.unist.ac.kr/handle/201301/34972
Fulltext
https://ieeexplore.ieee.org/document/7314394
Citation
23rd IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, pp.69 - 73
Abstract
For applications related to human, such as Internet of Things (IoT) and wearable devices, near threshold voltage (NTV) technology has been proposed for the trade-off between performance and energy consumption. However, error-resilient techniques are required in the circuits to improve reliability of the NTV operation.
In this paper, we propose a low-overhead error-resilient system and a design flow for NTV operations. We use a new monitoring circuit, which can detect timing errors and find an optimal operation point of the system. Also, we propose two different methodologies, which are slack-based methodology and sensitivity-based methodology.
From the proposed monitoring system and the sensitivitybased sorting algorithm, benchmark results show that the optimal designs provide up to 46% monitoring area reduction maintaining similar error detection ability of the conventional error-resilient design.
Publisher
IEEE Computer Society
ISSN
2324-8432

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