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Shin, Heungjoo (신흥주)

Department
School of Mechanical, Aerospace and Nuclear Engineering(기계항공및원자력공학부)
Lab
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Issue DateTitleAuthor(s)TypeViewAltmetrics
2013-11The effect of channel height and electrode aspect ratio on redox cycling at carbon interdigitated array nanoelectrodes confined in a microchannelHeo, Jeong Il; Lim, Yeongjin; Shin, HeungjooARTICLE770 The effect of channel height and electrode aspect ratio on redox cycling at carbon interdigitated array nanoelectrodes confined in a microchannel
2013-11Monolithic carbon structures including suspended single nanowires and nanomeshes as a sensor platformLim, Yeongjin; Heo, Jeong-Il; Madou, Mark, et alARTICLE651 Monolithic carbon structures including suspended single nanowires and nanomeshes as a sensor platform
2013-06An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopyLee, Eunjoo; Kim, Minseo; Seong, Jungwoo, et alARTICLE714 An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy
2011-03Carbon Interdigitated Array Nanoelectrodes for Electrochemical ApplicationsHeo, J. I.; Shim, D. S.; Teixidor, G. Turon, et alARTICLE738 Carbon Interdigitated Array Nanoelectrodes for Electrochemical Applications
2010-06Current Application of Micro/Nano-Interfaces to Stimulate and Analyze Cellular ResponsesCho, Yoon-Kyoung; Shin, Heungjoo; Lee, Sung Kuk, et alARTICLE864 Current Application of Micro/Nano-Interfaces to Stimulate and Analyze Cellular Responses
2010-03Ac Dielectrophoresis of Tin Oxide Nanobelts Suspended in Ethanol: Manipulation and VisualizationKumar, Surajit; Peng, Zhengchun; Shin, Heungjoo, et alARTICLE738 Ac Dielectrophoresis of Tin Oxide Nanobelts Suspended in Ethanol: Manipulation and Visualization
2008-09Development of wafer-level batch fabrication for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probesShin, Heungjoo; Hesketh, P. J.; Mizaikofff, B., et alARTICLE568 Development of wafer-level batch fabrication for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probes
2007-09Bitmap-assisted focused ion beam fabrication of combined atomic force scanning electrochemical Microscopy probesMoon, Jong-Seok; Shin, Heungjoo; Mizaikoff, Boris, et alARTICLE512
2007-07Batch fabrication of atomic force microscopy probes with recessed integrated ring microelectrodes at a wafer levelShin, Heungjoo; Hesketh, Peter J.; Mizaikoff, Boris, et alARTICLE541 Batch fabrication of atomic force microscopy probes with recessed integrated ring microelectrodes at a wafer level
2007-07Frequency dependence of the electrochemical activity contrast in AC-scanning electrochemical microscopy and atomic force microscopy-AC-scanning electrochemical microscopy imagingEckhard, Kathrin; Kranz, Christine; Shin, Heungjoo, et alARTICLE525 Frequency dependence of the electrochemical activity contrast in AC-scanning electrochemical microscopy and atomic force microscopy-AC-scanning electrochemical microscopy imaging
2007-06Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)Eckhard, K.; Shin, Heungjoo; Mizaikoff, B., et alARTICLE534 Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)
2001-06Mixed lubrication analysis of cam/tappet interface on the direct acting type valvetrain systemShin, Heungjoo; Cho, MR; Han, DCARTICLE505
2000-08직접 구동형 밸브트레인 시스템의 캠-팔로워 접촉면의 접촉 응력 해석Cho, Myungrae; Shin, Heungjoo; Han, DongcheolARTICLE684
2000-07A study on the circumferential groove effects on the minimum oil film thickness in engine bearingsCho, MR; Shin, Heungjoo; Han, DCARTICLE576
1998-09밸브 트레인 시스템의 태핏 회전 측정 장치의 개발Kim, Hyungjun; Cho, Myungrae; Shin, Heungjoo, et alARTICLE660

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