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Kim, Duck Young
Smart Factory Lab (SF)
Research Interests
  • Smart factory, Smart control, Failure analysis, Simulation

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실시간 고장 예방을 위한 이벤트 기반 결함원인분석 시스템

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Title
실시간 고장 예방을 위한 이벤트 기반 결함원인분석 시스템
Other Titles
An Event-Driven Failure Analysis System for Real-Time Prognosis
Author
Lee, Yang JiKim, Duck YoungHwang, Min SoonCheong, Young Soo
Issue Date
2013-08
Publisher
한국CAD/CAM학회
Citation
한국CAD/CAM학회 논문집, v.18, no.4, pp.250 - 257
Abstract
This paper introduces a failure analysis procedure that underpins real-time fault prognosis. In the previous study, we developed a systematic eventization procedure which makes it possible to reduce the original data size into a manageable one in the form of event logs and eventually to extract failure patterns efficiently from the reduced data. Failure patterns are then extracted in the form of event sequences by sequence-mining algorithms, (e.g. FP-Tree algorithm). Extracted patterns are stored in a failure pattern library, and eventually, we use the stored failure pattern information to predict potential failures. The two practical case studies (marine diesel engine and SIRIUS-II car engine) provide empirical support for the performance of the proposed failure analysis procedure. This procedure can be easily extended for wide application fields of failure analysis such as vehicle and machine diagnostics. Furthermore, it can be applied to human health monitoring & prognosis, so that human body signals could be efficiently analyzed.
URI
https://scholarworks.unist.ac.kr/handle/201301/9938
ISSN
1226-0606
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