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Choi, Jaehyouk
Integrated Circuits and Systems Lab (ICSL)
Research Interests
  • RF/Analog/Mixed IC design, low power CMOS IC, wired/wireless TRX IC, clock generation IC

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Analysis and Design of a Core-Size-Scalable Low Phase Noise LC-VCO for Multi-Standard Cellular Transceivers

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Title
Analysis and Design of a Core-Size-Scalable Low Phase Noise LC-VCO for Multi-Standard Cellular Transceivers
Author
Seong, TaehoKim, Jae JoonChoi, Jaehyouk
Issue Date
2015-03
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.62, no.3, pp.781 - 790
Abstract
A core-size-scalable LC-voltage-controlled oscillator (VCO) for multi-standard cellular transceivers was fabricated in a 65-nm CMOS process. Theoretical analysis showed that when core current is small a VCO with a larger core-size can achieve lower phase noise. However, when core current is large, a VCO with a smaller core-size can lower phase noise. Based on the analysis, the effective core-size of the VCO was designed to be scalable according to the core current, by switching the secondary core-transistors on or off. Thus, the proposed VCO becomes adaptive to multi-standard cellular transceivers. By turning on the switch, the VCO can operate in the low power (LP) mode for standards that require moderate phase noise in a tight power budget. On the other hand, by turning off the switch, the VCO can operate in the low noise (LN) mode for standards that demand stringent phase noise in a relaxed power budget. When the core current is set to 4 mA, the VCO in the LP mode achieved the phase noise of -127.9 dBc/Hz at the 3 MHz offset from 3.3-GHz signals. When the core current was set to 15 mA, phase noise of the VCO in the LN mode was minimized to -137.5 dBc/Hz at the same offset. The figure of merit (FOM) was -184.8 and - 186.5 dB, respectively. © 2004-2012 IEEE.
URI
https://scholarworks.unist.ac.kr/handle/201301/9801
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7004878
DOI
10.1109/TCSI.2014.2382191
ISSN
1549-8328
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