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Jeong, Hu Young
UCRF Electron Microscopy group
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Bipolar resistive switching characteristics of poly(3,4-ethylene-dioxythiophene): Poly(styrenesulfonate) thin film

Author(s)
Jeong, Hu YoungKim, Jong YunYoon, Tae HyunChoi, Sung-Yool
Issued Date
2010-01
DOI
10.1016/j.cap.2009.12.011
URI
https://scholarworks.unist.ac.kr/handle/201301/9089
Fulltext
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=77649237352
Citation
CURRENT APPLIED PHYSICS, v.10, no.1, pp.E46 - E49
Abstract
We investigated the reversible resistive switching of poly(3,4-ethylenedioxythiophene):polystyrenesulfonate (PEDOT:PSS) thin films sandwiched between Al electrodes. The J-V sweep curve showed a hysteretic behavior which depends on the polarity of the applied voltage bias. From the analysis of I-V curves, it was revealed that the charge transport through the junction was governed by the bulk space-charge-limited conduction (SCLC) model. Using transmission electron microscopy (TEM) analysis, it was confirmed that the initial high resistance state of PEDOT:PSS films is related with the segregation of PSS chains induced by redox reaction between a Al metal electrode and PEDOT:PSS film. Positive space charges present on the top region of PEDOT:PSS films can be proposed as a possible trap centers of electron trapping and detrapping process.
Publisher
ELSEVIER SCIENCE BV
ISSN
1567-1739

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