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| DC Field | Value | Language |
|---|---|---|
| dc.citation.title | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
| dc.contributor.author | Kim, Bong Ho | - |
| dc.contributor.author | Kuk, Song-Hyeon | - |
| dc.contributor.author | Hwang, Hyeon-Seong | - |
| dc.contributor.author | Jeong, Jaeyong | - |
| dc.contributor.author | Park, Youngkeun | - |
| dc.contributor.author | Suh, Yoon-Je | - |
| dc.contributor.author | Kim, Joon Pyo | - |
| dc.contributor.author | Lee, Chan Jik | - |
| dc.contributor.author | Cho, Byung Jin | - |
| dc.contributor.author | Kim, Sang Hyeon | - |
| dc.date.accessioned | 2026-03-26T10:42:00Z | - |
| dc.date.available | 2026-03-26T10:42:00Z | - |
| dc.date.created | 2026-03-24 | - |
| dc.date.issued | 2026-03 | - |
| dc.description.abstract | This work demonstrates that controlling the amplitude asymmetry of write pulses can effectively modulate degradation and recovery behaviors in Hf0.5Zr0.5O2 (HZO)-based ferroelectric field-effect transistors (FeFETs). Positive write (PW) scheme suppressed trap generation and achieved a high recovery rate of 98% at a memory window (MW) of 0.5 V, compared with 62% for the negative write (NW) pulse scheme. Furthermore, incorporating the electron detrapping (ED) mode operation with the PW scheme enabled a 91% recovery rate at a large MW of 1.2 V. These results highlight the critical role of suppressing hole-related degradation for effective and robust recovery operation in FeFETs. | - |
| dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
| dc.identifier.doi | 10.1109/TED.2026.3670290 | - |
| dc.identifier.issn | 0018-9383 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/90846 | - |
| dc.identifier.url | https://ieeexplore.ieee.org/abstract/document/11447438 | - |
| dc.identifier.wosid | 001719671700001 | - |
| dc.language | 영어 | - |
| dc.publisher | IEEE | - |
| dc.title | Effective Recovery Operation in FeFETs via Suppression of Hole Injection | - |
| dc.type | Article | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.type.docType | Article | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
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