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- Jeong, Hu Young
- UCRF Electron Microscopy group
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.number | 16 | - |
| dc.citation.title | APPLIED PHYSICS LETTERS | - |
| dc.citation.volume | 96 | - |
| dc.contributor.author | Kim, Byung Hoon | - |
| dc.contributor.author | Oh, Soon-Young | - |
| dc.contributor.author | Jeong, Hu Young | - |
| dc.contributor.author | Yu, Han Young | - |
| dc.contributor.author | Yun, Yong Ju | - |
| dc.contributor.author | Kim, Yark Yeon | - |
| dc.contributor.author | Hong, Won G. | - |
| dc.contributor.author | Lee, Jeong Yong | - |
| dc.contributor.author | Kim, Hae Jin | - |
| dc.date.accessioned | 2023-12-22T07:10:18Z | - |
| dc.date.available | 2023-12-22T07:10:18Z | - |
| dc.date.created | 2014-11-19 | - |
| dc.date.issued | 2010-04 | - |
| dc.description.abstract | Pd nanoparticle-doped vanadium pentoxide nanowires (Pd-VONs) were synthesized. Electrical current suppression was observed when the Pd-VON was exposed to hydrogen gas, which cannot be explained by the work function changes mentioned in previous report such as Pd-doped carbon nanotubes and SnO 2 nanowires. Using the x-ray photoelectron spectroscopy, we found that the reduction in PdO due to hydrogen exposure plays an important role in the current suppression of the Pd-VON. | - |
| dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.96, no.16 | - |
| dc.identifier.doi | 10.1063/1.3394003 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.scopusid | 2-s2.0-77951784930 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/9006 | - |
| dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=77951784930 | - |
| dc.identifier.wosid | 000277020600053 | - |
| dc.language | 영어 | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.title | Electrical current suppression in Pd-doped vanadium pentoxide nanowires caused by reduction in PdO due to hydrogen exposure | - |
| dc.type | Article | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
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