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Jeong, Hu Young
UNIST Central Research Facilities (UCRF)
Research Interests
  • Soft material characterization such as graphene using a low kV Cs-corrected TEM
  • Insitu-TEM characterization of carbon-based materials using nanofactory STM holder for Li-ion battery application
  • Structural characterization of mesoporous materials using SEM & TEM
  • Interface analysis between various oxides and metals through Cs-corrected (S)TEM
  • Resistive switching mechanism of graphene oxide thin films for RRAM application


Electrical current suppression in Pd-doped vanadium pentoxide nanowires caused by reduction in PdO due to hydrogen exposure

DC Field Value Language Kim, Byung Hoon ko Oh, Soon-Young ko Jeong, Hu Young ko Yu, Han Young ko Yun, Yong Ju ko Kim, Yark Yeon ko Hong, Won G. ko Lee, Jeong Yong ko Kim, Hae Jin ko 2014-11-21T00:06:05Z - 2014-11-19 ko 2010-04 -
dc.identifier.citation APPLIED PHYSICS LETTERS, v.96, no.16, pp. - ko
dc.identifier.issn 0003-6951 ko
dc.identifier.uri -
dc.identifier.uri ko
dc.description.abstract Pd nanoparticle-doped vanadium pentoxide nanowires (Pd-VONs) were synthesized. Electrical current suppression was observed when the Pd-VON was exposed to hydrogen gas, which cannot be explained by the work function changes mentioned in previous report such as Pd-doped carbon nanotubes and SnO 2 nanowires. Using the x-ray photoelectron spectroscopy, we found that the reduction in PdO due to hydrogen exposure plays an important role in the current suppression of the Pd-VON. ko
dc.description.statementofresponsibility open -
dc.language ENG ko
dc.publisher AMER INST PHYSICS ko
dc.subject Doped carbons ko
dc.subject Electrical current ko
dc.subject Hydrogen exposure ko
dc.subject Hydrogen gas ko
dc.subject PD nano particle ko
dc.subject Vanadium pentoxide ko
dc.subject Work function change ko
dc.title Electrical current suppression in Pd-doped vanadium pentoxide nanowires caused by reduction in PdO due to hydrogen exposure ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-77951784930 ko
dc.identifier.wosid 000277020600053 ko
dc.type.rims ART ko
dc.description.wostc 4 *
dc.description.scopustc 5 * 2015-05-06 * 2014-11-19 *
dc.identifier.doi 10.1063/1.3394003 ko
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