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- Kim, Kyung Rok
- Nano-Electronic Emerging Devices Lab.
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Non-uniform Interface Trap Distribution Modeling for 3D Fin Structure Device Reliability Analysis.
- Author(s)
- Song, Yoo Bin, Lee, Min Je, Jang, In Jun, 류민우, Kim, Kyung Rok
- Issued Date
- 2025-02-14
- Citation
- 제32회 한국반도체학술대회
- Publisher
- 한국반도체협회
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