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Test-Time Adaptation with Binary Feedback

Author(s)
Lee, TaeckyungChottananurak, SornKim, JunsuShin, JinwooGong, TaesikLee, Sung-Ju
Issued Date
2025-07-13
URI
https://scholarworks.unist.ac.kr/handle/201301/89768
Citation
International Conference on Machine Learning, pp.33005 - 33024
Abstract
Deep learning models perform poorly when domain shifts exist between training and test data. Test-time adaptation (TTA) is a paradigm to mitigate this issue by adapting pre-trained models using only unlabeled test samples. However, existing TTA methods can fail under severe domain shifts, while recent active TTA approaches requiring full-class labels are impractical due to high labeling costs. To address this issue, we introduce a new setting of TTA with binary feedback. This setting uses a few binary feedback inputs from annotators to indicate whether model predictions are correct, thereby significantly reducing the labeling burden of annotators. Under the setting, we propose BiTTA, a novel dual-path optimization framework that leverages reinforcement learning to balance binary feedback-guided adaptation on uncertain samples with agreementbased self-adaptation on confident predictions. Experiments show BiTTA achieves 13.3%p accuracy improvements over state-of-the-art baselines, demonstrating its effectiveness in handling severe distribution shifts with minimal labeling effort. The source code is available at https: //github.com/taeckyung/BiTTA.
Publisher
ML Research Press

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