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Woo, Kyung Seok
Emerging Semiconductor Technology Laboratory
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Localized Conduction Channels in Memristors

Author(s)
Woo, Kyung SeokWilliams, R. StanleyKumar, Suhas
Issued Date
2024-12
DOI
10.1021/acs.chemrev.4c00454
URI
https://scholarworks.unist.ac.kr/handle/201301/87694
Citation
CHEMICAL REVIEWS, v.125, no.1, pp.294 - 325
Abstract
Since the early 2000s, the impending end of Moore's scaling, as the physical limits to shrinking transistors have been approached, has fueled interest in improving the functionality and efficiency of integrated circuits by employing memristors or two-terminal resistive switches. Formation (or avoidance) of localized conducting channels in many memristors, often called "filaments", has been established as the basis for their operation. While we understand some qualitative aspects of the physical and thermodynamic origins of conduction localization, there are not yet quantitative models that allow us to predict when they will form or how large they will be. Here we compile observations and explanations of channel formation that have appeared in the literature since the 1930s, show how many of these seemingly unrelated pieces fit together, and outline what is needed to complete the puzzle. This understanding will be a necessary predictive component for the design and fabrication of post-Moore's-era electronics.
Publisher
AMER CHEMICAL SOC
ISSN
0009-2665
Keyword
PHASE-CHANGE MATERIALSELECTROCHEMICAL METALLIZATION MEMORYCHARGE DISPROPORTIONATIONMETAL-INSULATORAB-INITIOSWITCHING CHARACTERISTICSSTRUCTURAL TRANSITIONSNEUTRON-DIFFRACTIONIMPROVED UNIFORMITYRNIO3 PEROVSKITES

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