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TCAD-Based Variability Analysis and Optimization in 28-nm Ternary-CMOS Technology
- Author(s)
- LEE, Kwan Yong
- Advisor
- Kim, Kyung Rok
- Issued Date
- 2025-02
- URI
- https://scholarworks.unist.ac.kr/handle/201301/86528 http://unist.dcollection.net/common/orgView/200000867072
- Publisher
- Ulsan National Institute of Science and Technology
- Degree
- Master
- Major
- Department of Electrical Engineering
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