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- Shin, Hyung-Joon
- Nanoscale Materials Science Lab.
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Novel method for measuring dielectric constant of ultra-thin insulating film
- Author(s)
- Yoo, Dongyeop, Kim, Yohan, Shin, Hyung-Joon
- Issued Date
- 2024-08-29
- Citation
- The 5th International Workshop on Scanning Probe Microscopy
- Publisher
- Asia Pacific Center for Theoretical Physics
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