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정홍식

Jeong, Hongsik
Future Semiconductor Technology Lab.
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Ultralow-Power Programmable 3D Vertical Phase-Change Memory with Heater-All-Around Configuration

Author(s)
Hur, NamwookKim, YechanPark, BeomsungYoon, SohuiKim, SeunghwanLim, Dong-HyeokJeong, HongsikKwon, YoongwooSuh, Joonki
Issued Date
2025-04
DOI
10.1002/smtd.202401381
URI
https://scholarworks.unist.ac.kr/handle/201301/84866
Citation
SMALL METHODS, v.9, no.4, pp.2401381
Abstract
Recent advancements in phase-change memory (PCM) technology have predominantly stemmed from material-level designs, which have led to fast and durable device performances. However, there remains a pressing need to address the enormous energy consumption through device-level electrothermal solutions. Thus, the concept of a 3D heater-all-around (HAA) PCM fabricated along the vertical nanoscale hole of dielectric/metal/dielectric stacks is proposed. The embedded thin metallic heater completely encircles the phase-change material, so it promotes highly localized Joule heating with minimal loss. Hence, a low RESET current density of 6-8 MA cm(-2) and operation energy of 150-200 pJ are achieved even for a sizable hole diameter of 300 nm. Beyond the conventional 2D scaling of the bottom electrode contact, it accordingly enhances approximate to 80% of operational energy efficiency compared to planar PCM with an identical contact area. In addition, reliable memory operations of approximate to 10(5) cycles and the 3-bits-per-cell multilevel storage despite ultrathin (<10 nm) sidewall deposition of Ge2Sb2Te5 are optimized. The proposed 3D-scaled HAA-PCM architecture holds promise as a universally applicable backbone for emerging phase-change chalcogenides toward high-density, ultralow-power computing units.
Publisher
WILEY-V C H VERLAG GMBH
ISSN
2366-9608
Keyword (Author)
low-power electronicsnonvolatile memoryphase change memory3D devicesGe2Sb2Te5 (GST)
Keyword
GRAPHENECONTACTDEVICESSWITCHING CURRENT-DENSITY

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