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Park, Kibog
Emergent Materials & Devices Lab.
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dc.citation.startPage 2400139 -
dc.citation.title ADVANCED ELECTRONIC MATERIALS -
dc.contributor.author Song, Wonho -
dc.contributor.author Lee, Jung-Yong -
dc.contributor.author Kim, Junhyung -
dc.contributor.author Park, Jinyoung -
dc.contributor.author Jo, Jaehyeong -
dc.contributor.author Hyun, Eunseok -
dc.contributor.author Kim, Jiwan -
dc.contributor.author Park, Hyunjae -
dc.contributor.author Eom, Daejin -
dc.contributor.author Choi, Gahyun -
dc.contributor.author Park, Kibog -
dc.date.accessioned 2024-09-13T11:05:08Z -
dc.date.available 2024-09-13T11:05:08Z -
dc.date.created 2024-09-12 -
dc.date.issued 2024-09 -
dc.description.abstract The effective work-function of metal electrode is one of the major factors to determine the threshold voltage of metal/oxide/semiconductor junction. In this work, it is demonstrated experimentally that the effective work-function of the Aluminum (Al) electrode in Al/SiO2/n-Si junction increases significantly by approximate to 1.04 eV with the graphene interlayer inserted at Al/SiO2 interface. The device-physical analysis of solving Poisson equation analytically is provided when the flat-band voltage is applied to the junction, supporting that the large tuning of Al effective work-function may originate from the electric dipole layer formed by the off-centric distribution of electron orbitals between Al and graphene layer. Our work suggests the feasibility of constructing the dual-metal gate CMOS circuitry just by using Al electrodes with area-specific underlying graphene interlayer. -
dc.identifier.bibliographicCitation ADVANCED ELECTRONIC MATERIALS, pp.2400139 -
dc.identifier.doi 10.1002/aelm.202400139 -
dc.identifier.issn 2199-160X -
dc.identifier.scopusid 2-s2.0-85202769267 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/83781 -
dc.identifier.wosid 001304004800001 -
dc.language 영어 -
dc.publisher WILEY -
dc.title Largely-Tuned Effective Work-Function of Al/Graphene/SiO2/Si Junction with Electric Dipole Layer at Al/Graphene Interface -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science; Physics -
dc.type.docType Article; Early Access -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor flat-band voltage -
dc.subject.keywordAuthor graphene interlayer -
dc.subject.keywordAuthor MOS junction -
dc.subject.keywordAuthor capacitance-voltage curve -
dc.subject.keywordAuthor dipole layer -
dc.subject.keywordAuthor effective work-function of gate electrode -
dc.subject.keywordAuthor electric -
dc.subject.keywordPlus RAMAN-SPECTROSCOPY -
dc.subject.keywordPlus ALD -
dc.subject.keywordPlus GATE CMOS TECHNOLOGY -
dc.subject.keywordPlus GRAPHENE -

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