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DC Field | Value | Language |
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dc.citation.title | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.contributor.author | Ahn, Sang Hyo | - |
dc.contributor.author | Kim, Min Jae | - |
dc.contributor.author | Kim, Myoung | - |
dc.contributor.author | Song, Yoo Bin | - |
dc.contributor.author | Ryu, Min Woo | - |
dc.contributor.author | Kim, Kyung Rok | - |
dc.date.accessioned | 2024-07-16T11:05:14Z | - |
dc.date.available | 2024-07-16T11:05:14Z | - |
dc.date.created | 2024-07-12 | - |
dc.date.issued | 2024-06 | - |
dc.description.abstract | We demonstrate a high-performance and low-noise single-chip sub-terahertz (THz) imager array by integrating ground (gnd)-out trantenna ( tran sistor-an tenna ) with a reset switch, analog buffer, multiplexer, and preamplifier using 65-nm CMOS technology. The channel charge asymmetry of sub-THz pixel device is enhanced with ac-gnd and ac-open load impedance design for gnd-out and gnd-in trantenna, respectively. The reset modulation switch suppresses output overshoot. Thus, the detector delay time of gnd-out trantenna, with a considerably smaller output junction capacitance than gnd-in trantenna, is reduced to sub- mu s regime. In 0.1-THz direct illumination setup, the gnd-out trantenna with analog buffer circuitry experimentally achieves high-speed sub-THz imager operation up to 600 kHz with a commercial-level delay time = 0.98 mu s ( 15 times faster than gnd-in case). Owing to low-impedance analog buffer design for gnd-out trantenna with high-speed reset switch modulation ( similar to 300 kHz), a high responsivity ( R-V=620 kV/W) and ultralow noise-equivalent power (NEP = 8.44 pW/Hz (0.5) ) are obtained for the peripheral circuitry-integrated sub-THz imager. | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.identifier.doi | 10.1109/TED.2024.3414380 | - |
dc.identifier.issn | 0018-9383 | - |
dc.identifier.scopusid | 2-s2.0-85196763926 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/83181 | - |
dc.identifier.wosid | 001252506100001 | - |
dc.language | 영어 | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | High-Performance and Low-Noise Trantenna Sub-THz Imager With Low-Impedance Analog Buffers and Reset Switch | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic; Physics, Applied | - |
dc.relation.journalResearchArea | Engineering; Physics | - |
dc.type.docType | Article; Early Access | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Logic gates | - |
dc.subject.keywordAuthor | Simulation | - |
dc.subject.keywordAuthor | Plasmons | - |
dc.subject.keywordAuthor | Capacitance | - |
dc.subject.keywordAuthor | Analog buffer | - |
dc.subject.keywordAuthor | Terahertz radiation | - |
dc.subject.keywordAuthor | gnd-out | - |
dc.subject.keywordAuthor | high-speed | - |
dc.subject.keywordAuthor | noise-equivalent power (NEP) | - |
dc.subject.keywordAuthor | output junction capacitance | - |
dc.subject.keywordAuthor | reset switch | - |
dc.subject.keywordAuthor | responsivity | - |
dc.subject.keywordAuthor | sub-terahertz (THz) imager | - |
dc.subject.keywordAuthor | trantenna | - |
dc.subject.keywordAuthor | Detectors | - |
dc.subject.keywordAuthor | Terahertz communications | - |
dc.subject.keywordPlus | TERAHERTZ RADIATION | - |
dc.subject.keywordPlus | ANTENNA | - |
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