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박희천

Park, Heechun
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DC Field Value Language
dc.citation.conferencePlace US -
dc.citation.title IEEE International Symposium on Quality Electronic Design (ISQED), 2024 -
dc.contributor.author Yoon, Junghyun -
dc.contributor.author Park, Heechun -
dc.date.accessioned 2024-03-15T09:35:08Z -
dc.date.available 2024-03-15T09:35:08Z -
dc.date.created 2024-03-15 -
dc.date.issued 2024-04-03 -
dc.identifier.bibliographicCitation IEEE International Symposium on Quality Electronic Design (ISQED), 2024 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/81658 -
dc.publisher IEEE -
dc.title Design-Technology Co-Optimization with Standard Cell Layout Generator for Pin Configurations -
dc.type Conference Paper -
dc.date.conferenceDate 2024-04-03 -

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