Structural Analysis of 2D Materials with Atomic Resolution TEM

Abstract

The unusual properties of 2D materials directly rely on the atomic structure and defects of the materials. The study, thus, at atomic scale is crucial for in-depth understanding of 2D materials and provides insights into its applications. Atomic resolution imaging of individual atoms has been achieved using modern aberration-corrected transmission electron microscopes. This lecture covers the introduction to TEM and its basic imaging formation mechanism and electron diffraction theory. In addition, this provides the recent research progress on modern TEMs in practice and results on the atomic structure of monolayer and multilayer graphene, functionalized graphene, grain boundaries and furthermore the defect formation mechanisms in graphene, hexagonal boron nitride and MoS2.