BROWSE

Related Researcher

Author's Photo

Lee, Sukbin
Multidimensional Structural Materials Lab
Research Interests
  • Microstructural evolution, advanced characterization, computational materials science, 3D materials science, microstructure-property relation

ITEM VIEW & DOWNLOAD

Grain Boundary Character Distribution of Nanocrystalline Cu Thin Films Using Stereological Analysis of Transmission Electron Microscope Orientation Maps

Cited 11 times inthomson ciCited 10 times inthomson ci
Title
Grain Boundary Character Distribution of Nanocrystalline Cu Thin Films Using Stereological Analysis of Transmission Electron Microscope Orientation Maps
Author
Darbal, A. D.Ganesh, K. J.Liu, X.Lee, SukbinLedonne, J.Sun, T.Yao, B.Warren, A. P.Rohrer, G. S.Rollett, A. D.Ferreira, P. J.Coffey, K. R.Barmak, K.
Issue Date
2013-02
Publisher
CAMBRIDGE UNIV PRESS
Citation
MICROSCOPY AND MICROANALYSIS, v.19, no.1, pp.111 - 119
Abstract
Stereological analysis has been coupled with transmission electron microscope (TEM) orientation mapping to investigate the grain boundary character distribution in nanocrystalline copper thin films. The use of the nanosized (<5 nm) beam in the TEM for collecting spot diffraction patterns renders an order of magnitude improvement in spatial resolution compared to the analysis of electron backscatter diffraction patterns in the scanning electron microscope. Electron beam precession is used to reduce dynamical effects and increase the reliability of orientation solutions. The misorientation distribution function shows a strong misorientation texture with a peak at 60 degrees/[111], corresponding to the Sigma 3 misorientation. The grain boundary plane distribution shows {111} as the most frequently occurring plane, indicating a significant population of coherent twin boundaries. This study demonstrates the use of nanoscale orientation mapping in the TEM to quantify the five-parameter grain boundary distribution in nanocrystalline materials.
URI
https://scholarworks.unist.ac.kr/handle/201301/7868
URL
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/grain-boundary-character-distribution-of-nanocrystalline-cu-thin-films-using-stereological-analysis-of-transmission-electron-microscope-orientation-maps/E5655561620ADF4EFA58272B5707D076
DOI
10.1017/S1431927612014055
ISSN
1431-9276
Appears in Collections:
MSE_Journal Papers
Files in This Item:
There are no files associated with this item.

find_unist can give you direct access to the published full text of this article. (UNISTARs only)

Show full item record

qrcode

  • mendeley

    citeulike

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

MENU