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- Yoon, Tae-Sik
- Nano Semiconductor Research Lab.
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Process-dependent Synaptic and Nonvolatile Memory Characteristics in Thin-film Transistors with HfOx Gate Insulator and ZnO Channel Layer
- Author(s)
- Lee, Hyerin, Beom, Keonwon, Kim, Minju, Yoon, Tae-Sik
- Issued Date
- 2020-02-13
- Citation
- 제27회 한국반도체학술대회
- Publisher
- 한국반도체연구조합
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