File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Lee, Ki-Suk
- Creative Laboratory for Advanced Spin Systems (CLASS)
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Atomic-scale depth selectivity of soft x-ray resonant Kerr effect
- Author(s)
- Lee, Ki-Suk, Kim, SK, Kortright, JB
- Issued Date
- 2003-11
- Citation
- APPLIED PHYSICS LETTERS, v.83, no.18, pp.3764 - 3766
- Abstract
- A study was performed to demonstrate that soft x-ray Kerr rotation, θK, versus incident grazing angle, φ, and energy, hv, measurements provide an extremely large depth selectivity on the atomic scales even in an ultrathin single layer, simply by choosing appropriate φ and hv around the resonant regions. Both the experimental and simulation results of φ vs θK measurements were considered for depth-varying magnetization reversals in a 3.5-nm-thick Co layer of NiFe/FeMn/Co/Pd films.
- Publisher
- AMER INST PHYSICS
- ISSN
- 0003-6951
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.