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Lee, Ki-Suk
Creative Lab. for Advanced Spin Systems (CLASS)
Research Interests
  • Magnetism, spintronics, spin dynamics, rare-earth free magnet

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Atomic-scale depth selectivity of soft x-ray resonant Kerr effect

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Title
Atomic-scale depth selectivity of soft x-ray resonant Kerr effect
Author
Lee, Ki-SukKim, SKKortright, JB
Keywords
ULTRATHIN-FILM STRUCTURE; SENSITIVITY; INTERFACE; FE
Issue Date
2003-11
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.83, no.18, pp.3764 - 3766
Abstract
A study was performed to demonstrate that soft x-ray Kerr rotation, θK, versus incident grazing angle, φ, and energy, hv, measurements provide an extremely large depth selectivity on the atomic scales even in an ultrathin single layer, simply by choosing appropriate φ and hv around the resonant regions. Both the experimental and simulation results of φ vs θK measurements were considered for depth-varying magnetization reversals in a 3.5-nm-thick Co layer of NiFe/FeMn/Co/Pd films.
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DOI
10.1063/1.1622123
ISSN
0003-6951
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MSE_Journal Papers
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