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최경진

Choi, Kyoung Jin
Energy Conversion Materials Lab.
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dc.citation.endPage 621 -
dc.citation.number 3 -
dc.citation.startPage 615 -
dc.citation.title JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B -
dc.citation.volume 19 -
dc.contributor.author Choi, Kyoung Jin -
dc.contributor.author Lee, JL -
dc.date.accessioned 2023-12-22T11:44:34Z -
dc.date.available 2023-12-22T11:44:34Z -
dc.date.created 2014-10-22 -
dc.date.issued 2001-05 -
dc.description.abstract Capacitance deep-level transient spectroscopy (DLTS) was used to study surface states on aluminum compounds. Two hole-like traps were observed in pseudomorphic high-electron-mobility transistor with a multifinger gate. No hole-like signals were observed in the DLTS spectra of the fat field-effect transistor (FATFET) having negligible ratio of the ungated surface to the total area between the source and the drain. The activation energies of both surface states were measured to be 0.50±0.03 and 0.81±0.01 eV. -
dc.identifier.bibliographicCitation JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.19, no.3, pp.615 - 621 -
dc.identifier.doi 10.1116/1.1368679 -
dc.identifier.issn 1071-1023 -
dc.identifier.scopusid 2-s2.0-0035326449 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/7705 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0035326449 -
dc.identifier.wosid 000169366600003 -
dc.language 영어 -
dc.publisher A V S AMER INST PHYSICS -
dc.title Surface states on n-type Al0.24Ga0.76As characterized by deep-level transient spectroscopy -
dc.type Article -
dc.description.journalRegisteredClass scopus -

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