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Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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In situ transmission electron microscopy observation of 3C-SiC heteroepitaxial growth on Si nanomembrane

Author(s)
Kim, KangsikSon, SeungwooLee, SeonwooAhn, Jong-HyunLee, Zonghoon
Issued Date
2022-08-01
URI
https://scholarworks.unist.ac.kr/handle/201301/75637
Citation
Microscopy & Microanalysis 2022
Publisher
Microscopy Society of America

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