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- Kim, Ju-Young
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Improvement of Structural Stability and Characterization of Nanoscale Defects in Amorphous Alumina Thin Film
- Author(s)
- Woo, Jeong-Hyun, Hwang, Gyeong-Seok, Yoo, Hyeonji, Kim, Ju-Young
- Issued Date
- 2022-10-10
- Citation
- 2022 MS&T (materials science & technology)
- Publisher
- ACerS, AIST, TMS
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