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- Suh, Joonki
- Semiconductor Nanotechnology Lab.
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차세대 상변화 메모리소재용 Ge2Sb2Te5 박막 두께 표준물질 개발 및 보급
- Alternative Title
- Development and distribution of thickness controlled standard Ge2Sb2Te5 thin films for next-generation phase change memory
- Author(s)
- Suh, Joonki
- Issued Date
- 2022-10-28
- Citation
- 2022 한국세라믹학회 추계학술대회
- Publisher
- 한국세라믹학회
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