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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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In situ observation of crack deflection by nanoparticles in graphene
- Author(s)
- Kim, Kangsik, Yoon, Jongchan, Jang, Younggeun, Lee, Zonghoon
- Issued Date
- 2022-11-03
- Citation
- 2022 한국현미경학회 추계학술대회
- Publisher
- 한국현미경학회
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