GIXS Techniques for Structural-Property Correlation Study of Energy-Related Materials

Abstract

Silicon-based solar cells occupy ca. 85% of the commercial market due to their high efficiency and long lifespan, but it is difficult to lower the unit cost due to expensive materials and complicated manufacturing processes, while the manufacturing process is relatively simple and economical. The perovskite solar cell has achieved a high photoelectric efficiency of 25.7% at present while making rapid technological progress in a short period of time [1]. However, the basic physical properties and principles related to high photoelectric efficiency and stability issues have not been sufficiently scientifically identified, and commercialization has not yet been achieved due to issues such as the use of green materials, long-term stability, and securing high-efficiency large-area manufacturing technology. When forming perovskite thin films, real-time structural studies under various conditions, such as antisolvent, additives, annealing temperature, humidity, light, and heat treatment time, are very useful. It would be even more useful if metastable structures that could be found in real-time studies could provide basic information about structural integrity, long-term stability, and high efficiency. In this lecture, not only studies related to phase transition and crystal structure formation, but also the effects of structures such as electron transport layer (ETL), interfacial layer, active perovskite, and hole transport layer (HTL) on efficiency and stability are discussed using synchrotron-based ex- and in-situ GIXS techniques [1-3]. In addition, useful contents for perovskite thin film experiments and data processing, such as a background subtraction program for obtaining sample data and a program for processing large amounts of data, are briefly introduced.

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