ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, v.63, no.3, pp.229 - 233
Abstract
The composition planes of the inversion boundary induced by the addition of Sb2O3 to ZnO ceramics were analyzed crystallographically by the application of electron back-scattered diffraction (EBSD) analysis and stereographic projection techniques. The inversion boundary was determined to consist of three discrete composition planes, {0001}, {101̄1}, {101̄0}.