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Jo, Wook
Sustainable Functional Ceramics Lab.
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Characterization of pyramidal inversion boundaries in Sb2O 3-doped ZnO by using electron back-scattered diffraction (EBSD)

Author(s)
Jo, WookPark, ChanKim, Doh-Yeon
Issued Date
2007-04
DOI
10.1107/S0108767307000748
URI
https://scholarworks.unist.ac.kr/handle/201301/7446
Fulltext
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=34247351606
Citation
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, v.63, no.3, pp.229 - 233
Abstract
The composition planes of the inversion boundary induced by the addition of Sb2O3 to ZnO ceramics were analyzed crystallographically by the application of electron back-scattered diffraction (EBSD) analysis and stereographic projection techniques. The inversion boundary was determined to consist of three discrete composition planes, {0001}, {101̄1}, {101̄0}.
Publisher
WILEY-BLACKWELL
ISSN
2053-2733
Keyword
PERCENT PBTIO3 CERAMICSABNORMAL GRAIN-GROWTHZINC-OXIDEANTIPHASE BOUNDARIESMOL-PERCENTLAYERSTWINBEHAVIORBATIO3GAAS

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