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A Proposed On-die Oscilloscope for Monitoring of Power Noise waveform inside IC due to Transient Stress Events
- Author(s)
- Zakirbek, Mamatair uulu
- Advisor
- Kim, Jingook
- Issued Date
- 2021-08
- URI
- https://scholarworks.unist.ac.kr/handle/201301/73419 http://unist.dcollection.net/common/orgView/200000507071
- Publisher
- Ulsan National Institute of Science and Technology (UNIST)
- Degree
- Master
- Major
- Department of Electrical Engineering
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