A novel approach for in-situ monitoring of deflecting, freely suspended nanomembranes with an embedded carbon nanotube array as a central monolayer by applying Raman spectroscopy was presented. The central layer provides not only significant reinforcement of the nanomembranes, but also generates a strong resonance Raman scattering. This can be used for the direct monitoring of internal stresses with high precision and localization, and in real-time. Results show a two-stage deformational process for these nanomembranes, as indicated by very different Raman peak shifts at low and high deflections.