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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Tensile and Fracture Behavior of Monolithic Ultra-thin Amorphous Carbon by In Situ TEM Nanomechanical Testing
- Author(s)
- Yoon, Jongchan, Jang, Younggeun, Kim, Kangsik, Kim, Jaemin, Son, Seungwoo, Lee, Zonghoon
- Issued Date
- 2023-09-12
- Citation
- The 20th International Microscopy Congress
- Publisher
- International Federation of Societies for Microscopy
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