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- Yoon, Tae-Sik
- Nano Semiconductor Research Lab.
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Low-Operation Voltage Non-Volatile Memory Characteristics with Oxide-Semiconductor Thin-Film Transistors Through Interaction Between Oxide Semiconductor Channel and Gate Oxide
- Author(s)
- Han, Jimin, Jeong, Boyoung, Yoon, Tae-Sik
- Issued Date
- 2023-04-12
- Citation
- 2023 Materials Research Society Spring Meeting, pp.EL21.08.02
- Publisher
- Materials Research Society
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