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Kim, Jin Young
Next Generation Energy Laboratory
Research Interests
  • Polymer solar cells, QD solar cells, organic-inorganic hybrid solar cells, perovskite solar cells, OLEDs, PeLEDs, organic FETs

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Optical spectroscopic characterization of plasma-polymerized thin films

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Title
Optical spectroscopic characterization of plasma-polymerized thin films
Author
Lee, KChang, YKim, Jin Young
Keywords
Optical spectroscopy;  Plasma processing and deposition;  Polymers
Issue Date
2003-01
Publisher
ELSEVIER SCIENCE SA
Citation
THIN SOLID FILMS, v.423, no.2, pp.131 - 135
Abstract
We report optical spectroscopic measurements of plasma-polymerized thin films coated on aluminum (Al) substrates over a spectral range from 0.01 to 6 eV, While the reflectance spectra, R(omega), remain almost unchanged in the infrared range as compared with the bare Al, R(omega) starts to decrease significantly in the higher energy above 2.5 eV. This decrease in R(omega) arises from electronic absorptions characteristic of the polymer films. Moreover, the details of R(omega) in the energy above 3 eV depend on the fabrication conditions of the polymer films. Our results, therefore, demonstrate that this optical measurement can be an excellent method to characterize the quality of polymer films deposited by the plasma polymerization process.
URI
https://scholarworks.unist.ac.kr/handle/201301/6572
DOI
10.1016/S0040-6090(02)01050-7
ISSN
0040-6090
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