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Jeong, Hu Young
UCRF Electron Microscopy group
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Coherent consolidation of trillions of nucleations for mono-atom step-level flat surfaces

Author(s)
Ha, TaewooSeo, Yu-SeongKim, Teun-TeunLamichhane, BipinKim, Young-HoonKim, Su JaeLee, YousilKim, Jong ChanPark, Sang EonSim, Kyung IkKim, Jae HoonKim, Yong InKim, Seon JeJeong, Hu YoungLee, Young HeeKim, Seong-GonKim, Young-MinHwang, JungseekJeong, Se-Young
Issued Date
2023-02
DOI
10.1038/s41467-023-36301-w
URI
https://scholarworks.unist.ac.kr/handle/201301/65017
Citation
NATURE COMMUNICATIONS, v.14, no.1, pp.685
Abstract
Constructing a mono-atom step-level ultra-flat material surface is challenging, especially for thin films, because it is prohibitively difficult for trillions of clusters to coherently merge. Even though a rough metal surface, as well as the scattering of carriers at grain boundaries, limits electron transport and obscures their intrinsic properties, the importance of the flat surface has not been emphasised sufficiently. In this study, we describe in detail the initial growth of copper thin films required for mono-atom step-level flat surfaces (MSFSs). Deposition using atomic sputtering epitaxy leads to the coherent merging of trillions of islands into a coplanar layer, eventually forming an MSFS, for which the key factor is suggested to be the individual deposition of single atoms. Theoretical calculations support that single sputtered atoms ensure the formation of highly aligned nanodroplets and help them to merge into a coplanar layer. The realisation of the ultra-flat surfaces is expected to greatly assist efforts to improve quantum behaviour by increasing the coherency of electrons. Constructing atomically flat surface in a single crystal ultrathin film is difficult owing to the coherent merging of trillions of clusters. Here the authors establish the initial growth mechanism of a single crystal Cu thin film with atomically flat surface using atomic sputtering epitaxy.
Publisher
NATURE PORTFOLIO
ISSN
2041-1723
Keyword
SINGLE-CRYSTALELECTRICAL-RESISTIVITYCOPPER-FILMSMETAL-FILMSGROWTHCONDUCTIVITYMONOLAYER

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