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김정환

Kim, Junghwan
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Effects of sulfur substitution in amorphous InGaZnO4: optical properties and first-principles calculations

Author(s)
Kim, JunghwanHiramatsu, HidenoriHosono, HideoKamiya, Toshio
Issued Date
2015-07
DOI
10.2109/jcersj2.123.537
URI
https://scholarworks.unist.ac.kr/handle/201301/62121
Citation
JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, v.123, no.1439, pp.537 - 541
Abstract
Amorphous InGaZnO4-xSx thin films were fabricated using a polycrystalline InGaZnO4 target by pulsed laser deposition in an H2S gas flow. The optical band gap first decreased from 3.05 to 1.65 eV as x increased from 0 to 1.5, and then increased to 2.6 eV at larger x, showing a bandgap bowing behavior. All the sulfur-containing films have high resistance beyond our measurement limit. Film density of the a-InGaZnS4 film was decreased by similar to 40% from that of a-InGaZnO4. Density functional theory calculations were performed to explain these results. (C) 2015 The Ceramic Society of Japan. All rights reserved.
Publisher
CERAMIC SOC JAPAN-NIPPON SERAMIKKUSU KYOKAI
ISSN
1882-0743
Keyword (Author)
Amorphous oxide semiconductorDensity functional theoryBand gap bowingOxysulfideAnion dopingNetwork structure
Keyword
OXIDE SEMICONDUCTOR A-INGAZNO4-XELECTRONIC-STRUCTUREFABRICATIONSTATESMODEL

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