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Chung, Kunook
Mixed Dimensional Materials and Devices Lab.
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On-chip optical spectrometer based on GaN wavelength-selective nanostructural absorbers

Author(s)
Sarwar, TubaCheekati, SrinivasaChung, KunookKu, Pei-Cheng
Issued Date
2020-02
DOI
10.1063/1.5143114
URI
https://scholarworks.unist.ac.kr/handle/201301/57190
Fulltext
https://aip.scitation.org/doi/10.1063/1.5143114
Citation
APPLIED PHYSICS LETTERS, v.116, no.8
Abstract
A spectrometer concept based on wavelength-selective semiconductor photodiodes is proposed and demonstrated. The absorption properties of individual photodiodes were tuned via local strain engineering in nanostructured InGaN/GaN. By varying the diameters of individual nanopillars, the cutoff wavelengths of absorption were varied across the chip. The intrinsic wavelength selectivity is insensitive to the incident angle of light. The top-down fabrication process shown in this work is also compatible with scalable manufacturing. A proof-of-concept spectrometer was demonstrated based on 14 photodiodes, without any external optics or spectral filtering components, in the wavelength range of 450-590nm. Using a non-negative least squares algorithm enhanced by orthogonal matching pursuit, the spectrum of a test light source was reconstructed.
Publisher
American Institute of Physics
ISSN
0003-6951

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