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권오훈

Kwon, Oh Hoon
Ultrafast Laser Spectroscopy and Nano-microscopy Lab.
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Cathodoluminescence in Ultrafast Electron Microscopy

Author(s)
Kim, Ye-JinKwon, Oh Hoon
Issued Date
2021-12
DOI
10.1021/acsnano.1c06260
URI
https://scholarworks.unist.ac.kr/handle/201301/55117
Fulltext
https://pubs.acs.org/doi/10.1021/acsnano.1c06260
Citation
ACS NANO, v.15, no.12, pp.19480 - 19489
Abstract
Implementing the modern technologies of light-emitting devices, light harvesting, and quantum information processing requires the understanding of the structure-function relations at spatial scales below the optical diffraction limit and time scales of energy and information flows. Here, we distinctively combine cathodoluminescence (CL) with ultrafast electron microscopy (UEM), termed CL-UEM, because CL and UEM synergetically afford the required spectral and spatiotemporal sensitivities, respectively. For color centers in nanodiamonds, we demonstrate the measurement of CL lifetime with a local sensitivity of 50 nm and a time resolution of 100 ps. It is revealed that the emitting states of the color centers can be populated through charge transfer among the color centers across diamond lattices upon high-energy electron beam excitation. The technical advance achieved in this study will facilitate the specific control over energy conversion at nanoscales, relevant to quantum dots and single-photon sources.
Publisher
AMER CHEMICAL SOC
ISSN
1936-0851
Keyword (Author)
cathodoluminescencecarrier transfernanodiamondsnitrogen-vacancy color centerstime-resolved spectroscopyultrafast electron microscopywide-bandgap materials
Keyword
CARRIER DYNAMICSNV CENTERSNANODIAMONDSDECAY

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