SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.7, no.3B, pp.B167 - B169
Abstract
We measure the hot phonon population of the GaAs LO phonons using a picosecond Raman scattering technique. Our samples were a series of GaAs/Al0.4Ga0.6As superlattices (SLS) with a fixed well width (L(Z)) and varying barrier width (L(b)). An abrupt increase in the phonon generation rate was observed as L(b) decreased over a narrow range. This is interpreted as the onset of significant well-to-well coupling of the confined GaAs LO phonons. An estimate of the LO phonon penetration depth into the Al0.4Ga0.6As barriers is obtained from this transition.