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Ruoff, Rodney S.
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Characterization of thermally reduced graphene oxide by imaging ellipsometry

Author(s)
Jung, InhwaVaupel, MatthiasPelton, MatthewPiner, RichardDikin, Drnitriy A.Stankovich, SashaAn, JinhoRuoff, Rodney S.
Issued Date
2008-06
DOI
10.1021/jp802173m
URI
https://scholarworks.unist.ac.kr/handle/201301/54395
Fulltext
https://pubs.acs.org/doi/10.1021/jp802173m
Citation
JOURNAL OF PHYSICAL CHEMISTRY C, v.112, no.23, pp.8499 - 8506
Abstract
The dispersion functions for the refractive index and the extinction coefficient of single- and multiple-layer graphene oxide samples were measured by imaging spectroscopic ellipsometry in the wavelength range of 350-1000 nm and were compared to previously reported results measured by confocal microscopy. The dispersion functions for thin platelets were also compared to those obtained by standard spectroscopic ellipsometry on a deposit consisting of many overlapping graphene oxide layers. Changes were observed in both the thickness of the deposits and the values of the dispersion parameters following heating. A model is proposed to explain these observations, based on the removal of water between the graphene-oxide layers upon thermal treatment.
Publisher
AMER CHEMICAL SOC
ISSN
1932-7447
Keyword
AQUEOUS DISPERSIONS

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