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Integration of reduced graphene oxide into organic field-effect transistors as conducting electrodes and as a metal modification layer

Author(s)
Lee, Chen-GuanPark, SungjinRuoff, Rodney S.Dodabalapur, Ananth
Issued Date
2009-07
DOI
10.1063/1.3176216
URI
https://scholarworks.unist.ac.kr/handle/201301/54363
Fulltext
https://aip.scitation.org/doi/10.1063/1.3176216
Citation
APPLIED PHYSICS LETTERS, v.95, no.2, pp.023304
Abstract
The characteristics of thin-film transistors (TFTs) with pentacene active layers and source/drain contact layers consisting of either Au, Au coated with highly reduced graphene oxide (HRG), or plain HRG, are compared. It is shown that the incorporation of HRG as an interfacial material between gold source/drain contacts and pentacene in TFT devices results in improved electrical characteristics. The effect of the HRG layer is to improve the gold/pentacene interface leading to better charge injection, lower losses at the interface, and, consequently, higher effective carrier mobility.
Publisher
AMER INST PHYSICS
ISSN
0003-6951
Keyword (Author)
semiconductor-metal boundariesthin film transistorscarrier mobilitycharge injectionelectrodesgoldgrapheneorganic field effect transistorsorganic semiconductors
Keyword
SURFACE-TREATMENTPENTACENEMORPHOLOGY

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