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- Ruoff, Rodney S.
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Evaluation of elastic modulus of ultra-thin vermiculite membranes by contact mode atomic force microscopy imaging
- Author(s)
- Suk, Ji Won, Piner, Richard D., An, Jinho, Ruoff, Rodney S.
- Issued Date
- 2013-01
- Citation
- THIN SOLID FILMS, v.527, pp.205 - 209
- Abstract
- Mechanical properties of nanometer-thick multilayer vermiculite, a layered silicate, were investigated by atomic force microscopy (AFM) contact mode imaging. Membranes suspended over circular holes were with exfoliated vermiculite platelets. The elastic modulus and pre-stress of each membrane were obtained using AFM combined with finite element analysis. The exfoliated multilayer vermiculite membranes had an average in-plane elastic modulus and average pre-stress of 175 +/- 16 GPa and 55 +/- 13 MPa, respectively.
- Publisher
- ELSEVIER SCIENCE SA
- ISSN
- 0040-6090
- Keyword (Author)
- Finite element analysis, Vermiculite, Clay, Atomic force microscopy, Mechanical properties, Membrane
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