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김명수

Kim, Myungsoo
Nano Electronics and Technology Lab.
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High-Performance Transition Metal Dichalcogenide Photodetectors Enhanced by Self-Assembled Monolayer Doping

Author(s)
Kang, Dong-HoKim, MyungsooShim, JaewooJeon, JeahoPark, Hyung-YoulJung, Woo-ShikYu, Hyun-YongPang, Chang-HyunLee, SungjooPark, Jin-Hong
Issued Date
2015-07
DOI
10.1002/adfm.201501170
URI
https://scholarworks.unist.ac.kr/handle/201301/53883
Citation
ADVANCED FUNCTIONAL MATERIALS, v.25, no.27, pp.4219 - 4227
Abstract
Most doping research into transition metal dichalcogenides (TMDs) has been mainly focused on the improvement of electronic device performance. Here, the effect of self-assembled monolayer (SAM)-based doping on the performance of WSe2- and MoS2-based transistors and photodetectors is investigated. The achieved doping concentrations are approximate to 1.4 x 10(11) for octadecyltrichlorosilane (OTS) p-doping and approximate to 10(11) for aminopropyltriethoxysilane (APTES) n-doping (nondegenerate). Using this SAM doping technique, the field-effect mobility is increased from 32.58 to 168.9 cm(2) V-1 s in OTS/WSe2 transistors and from 28.75 to 142.2 cm(2) V-1 s in APTES/MoS2 transistors. For the photodetectors, the responsivity is improved by a factor of approximate to 28.2 (from 517.2 to 1.45 x 10 4 A W-1) in the OTS/WSe2 devices and by a factor of approximate to 26.4 (from 219 to 5.75 x 10 3 A W-1) in the APTES/MoS2 devices. The enhanced photoresponsivity values are much higher than that of the previously reported TMD photodetectors. The detectivity enhancement is approximate to 26.6-fold in the OTS/WSe2 devices and approximate to 24.5-fold in the APTES/MoS2 devices and is caused by the increased photocurrent and maintained dark current after doping. The optoelectronic performance is also investigated with different optical powers and the air-exposure times. This doping study performed on TMD devices will play a significant role for optimizing the performance of future TMD-based electronic/optoelectronic applications.
Publisher
WILEY-V C H VERLAG GMBH
ISSN
1616-301X
Keyword
HIGH-K DIELECTRICSMULTILAYER MOS2TRANSISTORSPHOTOLUMINESCENCEPHOTOTRANSISTORSPHOTORESPONSETRANSPARENTBEHAVIOR

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